Available Equipment


Atomic to Micro Scale Microstructural Characterization of Materials

  1.  Focused Ion Beam/ Scanning Electron Microscope (FIB/FEG-SEM)

  2. Transmission Electron Microscope (TEM/HRTEM/STEM)

  3. Atomic Force Microscope with a Nano-indenter and PeakForce Quantitative Nanoscale Mechanical Characterization for materials (Electrical/Thermmal properties characterization)

  4. Optical Profiler (Contour GT) for surface roughness characterization and measurements

  5. Micro Computed Tomography (res: > 20 microns)) Scanner for non-destructive evaluation of the internal microstructure of processed materials (porosity, micro-cracks).

  6. X-ray Diffractometer for XRD (grain size, micro-strain, dislocation density, crystal structures, phases, elemental composition) 

  7. Micro-analysis and Electron Probe Microanalyzer Spectroscopy EPMA (EDS, EDX, EDXS or XEDS),

  8. Fourier Transform Infrared (FTIR) Spectroscopy

  9. Nano-hardness and Micromet micro-hardness tester


Static, Quasi-Static and High Strain Rate Mechanical Characterization

  1. 3D Digital Image Correlation (LaVision StrainMaster 3D DIC) for fatigue, compression tension, torsional and bi-axial tests

  2. Direct Impact Hopkinson Pressure Bar coupled with a 3D DIC system for high strain rate compression tests 

  3. Electrodynamic test frame with temperature test chambers (-80 degrees Celsius to 600 deg C)

  4. Universal Mechanical Tester Tribometer for tribological and wear characterization of materials under varying environments (fluid environments, high temperatures and scratch tests)

  5. Tension Compression test frames with 3-point bend, 4-point bend and Single Etched Notched Beam (SENB) testing fixtures

  6. Biaxial test frames coupled with 3D DIC